Microscopic studies of titanium dioxide planar particles morphology.Sample preparation. Measurement conditions

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61388980%3A_____%2F19%3A00523518" target="_blank" >RIV/61388980:_____/19:00523518 - isvavai.cz</a>

Alternative codes found

RIV/68407700:21720/19:00342021

Result on the web

<a href="https://www.sgem.org/index.php/elibrary?view=publication&task=show&id=6382" target="_blank" >https://www.sgem.org/index.php/elibrary?view=publication&task=show&id=6382</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.5593/sgem2019/6.1/S24.032" target="_blank" >10.5593/sgem2019/6.1/S24.032</a>

Result language

angličtina

Original language name

Microscopic studies of titanium dioxide planar particles morphology.Sample preparation. Measurement conditions

Original language description

Micro and nanoparticles of titanium dioxide are nowadays produced worldwide for a range of applications. In our project we focus on potential use of titanium dioxide particles as UV absorber (anti-UV protective coating) for wooden construction structures. We investigate the influence of different synthesis methods on particles’ morphology. Hence, material characterization has an important place in our research. Electron microscopy is a powerful tool to obtain information about the morphology of particles and their surface features. Nevertheless, for a reliable ultrahigh resolution image specific procedures regarding sample preparation must be adopted, and the measurement conditions must be carefully chosen. Usually this part of research is underestimated, and that is why we decided to address it in our paper. Scanning electron microscopy (SEM), scanning transmission electron microscopy and transmission electron microscopy (TEM) will be discussed. We will compare our experimental studies with current state of the art showing the influence of substrate (carbon tape or silicon wafers) and sample preparation on the obtained images. Titanium dioxide is a semiconductor therefore in case of observation of non-coated specimen in high vacuum mode one has to deal with the unavoidable charging effect. To reduce the signal‐to‐noise ratio, low energies were used (5 and 10kV) as well as different ways of obtaining the image (photo versus integrated image). Removing possible contaminants (thin hydrocarbon film) from the specimens’ surface by means of ultraviolet radiation revealed to be helpful. In order to complete the information obtained from scanning electron microscopy, scanning transmission and transmission electron microscopy were used as complementary methods.n

Czech name

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Czech description

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Type

D - Article in proceedings

CEP classification

—

OECD FORD branch

10402 - Inorganic and nuclear chemistry

Project

<a href="/en/project/GA18-26297S" target="_blank" >GA18-26297S: Interactions between wooden surface and planar particles of TiO2</a><br>

Continuities

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Publication year

2019

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection

19th International Multidisciplinary Scientific GeoConference SGEM 2019

ISBN

978-619-7408-88-1

ISSN

1314-2704

e-ISSN

—

Number of pages

8

Pages from-to

245-252

Publisher name

STEF92 Technology

Place of publication

Sofia

Event location

Albena

Event date

Jun 30, 2019

Type of event by nationality

WRD - Celosvětová akce

UT code for WoS article

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