Characterization of polystyrene and doped polymethylmethacrylate thin layers

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61389005%3A_____%2F05%3A00307936" target="_blank" >RIV/61389005:_____/05:00307936 - isvavai.cz</a>

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

Characterization of polystyrene and doped polymethylmethacrylate thin layers

Original language description

About 1 mu m thick films of polystyrene (PS) and polymethylmethacrylate (PMMA) were prepared from solutions using spin-coating method. The PMMA films were doped with diphenylsulfoxide (DS) up to 45 wt%. Glass transition temperature (T-g) of doped PMMA films was determined by DSC technique and relative permittivity (epsilon) as a function of the sample temperature was determined from capacitance measurement. The dependence of polarization (P) on electric field (E) and the temperature was measured using astandard Sawyer-Tower circuit. Spectral dependence of film refractive index was measured using a refractometer. The glass transition temperature T-g of PMMA/DS composite was found to be decreasing function of the DS concentration. Relative permittivityepsilon of unpolar PS is lower than that of polar PMMA. The PS permittivity does not depend on the sample temperature. For PMMA the permittivity is increasing function of both, DS dopant concentration and sample temperature.

Czech name

Charakteristiky tenkých vrstev polystyrenu a dopovaného polymethylmet krystalu

Czech description

Jsou studovány dielektivické a optické vlastnosti tenkých vrstev PS a PMMA připravovaných z roztoku spinových povlaků.

Type

J_x - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

CEP classification

BG - Nuclear, atomic and molecular physics, accelerators

OECD FORD branch

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Project

<a href="/en/project/GA106%2F03%2F0514" target="_blank" >GA106/03/0514: Modified polymers for tissue engineering</a><br>

Continuities

Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year

2005

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Journal of Materials Science-Materials in Electronics

ISSN

0957-4522

e-ISSN

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Volume of the periodical

16

Issue of the periodical within the volume

11-12

Country of publishing house

NL - THE KINGDOM OF THE NETHERLANDS

Number of pages

5

Pages from-to

761-765

UT code for WoS article

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EID of the result in the Scopus database

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