Ion track etching revisited: II. Electronic properties of aged tracks in polymers
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61389005%3A_____%2F18%3A00489283" target="_blank" >RIV/61389005:_____/18:00489283 - isvavai.cz</a>
Result on the web
<a href="http://dx.doi.org/10.1080/10420150.2018.1442454" target="_blank" >http://dx.doi.org/10.1080/10420150.2018.1442454</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1080/10420150.2018.1442454" target="_blank" >10.1080/10420150.2018.1442454</a>
Alternative languages
Result language
angličtina
Original language name
Ion track etching revisited: II. Electronic properties of aged tracks in polymers
Original language description
We compile here electronic ion track etching effects, such as capacitive-type currents, current spike emission, phase shift, rectification and background currents that eventually emerge upon application of sinusoidal alternating voltages across thin, aged swift heavy ion-irradiated polymer foils during etching. Both capacitive-type currents and current spike emission occur as long as obstacles still prevent a smooth continuous charge carrier passage across the foils. In the case of sufficiently high applied electric fields, these obstacles are overcome by spike emission. These effects vanish upon etchant breakthrough. Subsequent transmitted currents are usually of Ohmic type, but shortly after breakthrough (during the track' core etching) often still exhibit deviations such as strong positive phase shifts. They stem from very slow charge carrier mobility across the etched ion tracks due to retarding trapping/detrapping processes. Upon etching the track's penumbra, one occasionally observes a split-up into two transmitted current components, one with positive and another one with negative phase shifts. Usually, these phase shifts vanish when bulk etching starts. Current rectification upon track etching is a very frequent phenomenon. Rectification uses to inverse when core etching ends and penumbra etching begins. When the latter ends, rectification largely vanishes. Occasionally, some residual rectification remains which we attribute to the aged polymeric bulk itself. Last not least, we still consider background currents which often emerge transiently during track etching. We could assign them clearly to differences in the electrochemical potential of the liquids on both sides of the etched polymer foils. Transient relaxation effects during the track etching cause their eventually chaotic behaviour.
Czech name
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Czech description
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Classification
Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
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OECD FORD branch
20305 - Nuclear related engineering; (nuclear physics to be 1.3);
Result continuities
Project
<a href="/en/project/GBP108%2F12%2FG108" target="_blank" >GBP108/12/G108: Preparation, modification and characterization of materials by radiation</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Others
Publication year
2018
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Radiation Effects and Defects in Solids
ISSN
1042-0150
e-ISSN
—
Volume of the periodical
173
Issue of the periodical within the volume
1-2
Country of publishing house
GB - UNITED KINGDOM
Number of pages
17
Pages from-to
148-164
UT code for WoS article
000430097900017
EID of the result in the Scopus database
2-s2.0-85045467725