In-situ soft X-ray effects on graphene oxide films

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61389005%3A_____%2F18%3A00496765" target="_blank" >RIV/61389005:_____/18:00496765 - isvavai.cz</a>
Result on the web
<a href="http://dx.doi.org/10.1080/10420150.2018.1528599" target="_blank" >http://dx.doi.org/10.1080/10420150.2018.1528599</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1080/10420150.2018.1528599" target="_blank" >10.1080/10420150.2018.1528599</a>

Result language
angličtina
Original language name
In-situ soft X-ray effects on graphene oxide films
Original language description
In the present study, the effects of soft X-ray irradiation on graphene oxide (GO) films are discussed. In particular, by means of the XPS technique, it has been observed that even with a short exposure time GO is sensitive to the soft x-ray radiation. The X-ray radiation effects were investigated evaluating the C/O atomic ratio. Different irradiation times were applied ranging between 12 and 450 min. Significant modifications were detected in the C/O ratio and consequently in the C1s and O1s XPS profiles. At the highest soft X-ray exposure times, we disclosed the transformation of the C-OH groups to the phenol/aromatic diol ones.
Czech name
—
Czech description
—

Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
—
OECD FORD branch
10305 - Fluids and plasma physics (including surface physics)

Project
<a href="/en/project/GA16-05167S" target="_blank" >GA16-05167S: Ion beam modifications of graphene based structures</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year
2018
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Similar results(10)