Laser and ion beams graphene oxide reduction for microelectronic devices
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61389005%3A_____%2F20%3A00523925" target="_blank" >RIV/61389005:_____/20:00523925 - isvavai.cz</a>
Result on the web
<a href="https://doi.org/10.1080/10420150.2019.1701456" target="_blank" >https://doi.org/10.1080/10420150.2019.1701456</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1080/10420150.2019.1701456" target="_blank" >10.1080/10420150.2019.1701456</a>
Alternative languages
Result language
angličtina
Original language name
Laser and ion beams graphene oxide reduction for microelectronic devices
Original language description
Reduced graphene oxide (rGO) is a two-dimensional material, which is attracting increasing attention due to its special properties. It can be obtained by laser or ion beam irradiations of pristine graphene oxide (GO). It shows high mechanical resistance, considerable electric and thermal conductivity. All these rGO characteristics together with the high number of molecular species that can be embedded between its layers, make graphene oxide a potential material for electronic sensors or efficient support on which conductive strips, condensers, and micrometric electronic devices can be designed. In particular, as it is described in this paper, it is possible to carry out high spatial resolution lithography in GO by using a focused laser or micro ion beam in order to design macro, micro, and submicron geometrical structures. The use of the reduced graphene oxide for the laser and ion beam fabrication of electrical resistances and capacitances is presented.
Czech name
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Czech description
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Classification
Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
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OECD FORD branch
10305 - Fluids and plasma physics (including surface physics)
Result continuities
Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Others
Publication year
2020
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Radiation Effects and Defects in Solids
ISSN
1042-0150
e-ISSN
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Volume of the periodical
175
Issue of the periodical within the volume
3-4
Country of publishing house
GB - UNITED KINGDOM
Number of pages
15
Pages from-to
226-240
UT code for WoS article
000522130000002
EID of the result in the Scopus database
2-s2.0-85082713888