Ion channelling effect and damage accumulation in yttria-stabilized zirconia implanted with Ag ions

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61389005%3A_____%2F20%3A00524526" target="_blank" >RIV/61389005:_____/20:00524526 - isvavai.cz</a>
Alternative codes found
RIV/00216224:14740/20:00117382 RIV/44555601:13440/20:43895452 RIV/00216208:11320/20:10411351
Result on the web
<a href="https://doi.org/10.1016/j.nimb.2020.04.008" target="_blank" >https://doi.org/10.1016/j.nimb.2020.04.008</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1016/j.nimb.2020.04.008" target="_blank" >10.1016/j.nimb.2020.04.008</a>

Result language
angličtina
Original language name
Ion channelling effect and damage accumulation in yttria-stabilized zirconia implanted with Ag ions
Original language description
Yttria stabilized zirconia (YSZ) is well known as a radiation-resistant material. In this study, we present results from 400 keV Ag+ implantations of the (1 0 0) YSZ single crystals to fluences ranging from 5 x 10(15) to 5 x 10(16) cm(-2). The damage depth profiling and accumulation were probed using Rutherford backscattering spectrometry in the channelling mode (RBS-C), Transmission electron microscopy (TEM) and X-ray diffraction (XRD). The axial channelling effect of 2 MeV He+ ions in the implanted YSZ was studied. RBS-C provides us with detailed information about the displaced atoms density depth profiles progressing into greater depths, especially in the case of higher fluence. TEM was utilized to characterize the microstructure evolution and damage accumulation in the buried layer after the implantation. At the highest fluence (5 x 10(16) cm(-2)), Ag depth profile in the depth of 30-130 nm was identified in TEM bright and dark field images as well as in the electron diffraction patterns. Ag depth profiles are in agreement with depth profiles determined by RBS which show maximum Ag concentration in the depth of 94 nm. The reason for the decrease of the deformation identified by XRD in the vertical direction is the defect formation.
Czech name
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Czech description
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Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
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OECD FORD branch
20305 - Nuclear related engineering; (nuclear physics to be 1.3);

Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Publication year
2020
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical
Nuclear Instruments & Methods in Physics Research Section B
ISSN
0168-583X
e-ISSN
—
Volume of the periodical
474
Issue of the periodical within the volume
7
Country of publishing house
NL - THE KINGDOM OF THE NETHERLANDS
Number of pages
6
Pages from-to
29-34
UT code for WoS article
000531672400006
EID of the result in the Scopus database
2-s2.0-85083821229

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