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Slow light ion irradiation of polymers II: etching of microbeam-irradiated Makrofol

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61389005%3A_____%2F25%3A00619581" target="_blank" >RIV/61389005:_____/25:00619581 - isvavai.cz</a>

  • Result on the web

    <a href="https://www.tandfonline.com/doi/full/10.1080/10420150.2025.2474969" target="_blank" >https://www.tandfonline.com/doi/full/10.1080/10420150.2025.2474969</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1080/10420150.2025.2474969" target="_blank" >10.1080/10420150.2025.2474969</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Slow light ion irradiation of polymers II: etching of microbeam-irradiated Makrofol

  • Original language description

    Thin polymer foils were irradiated by low energy light ions at various fluences and thereafter etched until electric currents could penetrate the foils. Both the etchant breakthrough times, and the times when the maximum recordable current signal is reached by the measuring equipment, are recorded as characteristic parameters to describe the etchant process in detail. At low to medium fluences, their correlations with the applied ion fluence reveal details of both underlying polymeric properties and radiative mechanisms, such as differences in the behavior of amorphous and crystalline regions and of the existence of crazes and cracks, as well as radiation-induced compaction of radiation damage via chain scission. At excessive fluences, polymers start favoring crack formation as a consequence of proceeding carbonization. There is both a gradual, smooth opening of conductive channels emerging across the foils, and a sudden, full current onset, indicating that a different mechanism is at work. The use of microbeams has the advantage not only of measuring (as usual) the overall average values of the relevant parameters of complex materials such as polymers but also allowing one to select specific very small areas from many possibilities to examine their peculiarities. However, this eventually results in completely different findings depending on the region examined. Based on a general understanding of the material's composition and behavior, the main task is now to find out which obtained result describes which individual composition, and how it all can find its place in a general overview. This is what we did here. There is huge variability in the intrinsic parameters during the etching of polymers irradiated with low energy light ions, such that the characteristic etching times reveal much larger scattering in the data compared to, e.g. the simple case of etched track formation by swift heavy ions. However, using a few proposed strategies, it is possible to derive valuable new information about the etching dynamics in different regions of the polymer.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database

  • CEP classification

  • OECD FORD branch

    10304 - Nuclear physics

Result continuities

  • Project

    <a href="/en/project/GA22-17346S" target="_blank" >GA22-17346S: Preparation and properties of nanoporous membranes with functionalized nanoparticles</a><br>

  • Continuities

    I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Others

  • Publication year

    2025

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Radiation Effects and Defects in Solids

  • ISSN

    1042-0150

  • e-ISSN

    1029-4953

  • Volume of the periodical

    180

  • Issue of the periodical within the volume

    1-2

  • Country of publishing house

    GB - UNITED KINGDOM

  • Number of pages

    22

  • Pages from-to

    103-124

  • UT code for WoS article

    001479610700006

  • EID of the result in the Scopus database

    2-s2.0-105004259134