Electron beam degradation study of silicon polymers.

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61389013%3A_____%2F03%3A12030029" target="_blank" >RIV/61389013:_____/03:12030029 - isvavai.cz</a>

Alternative codes found

RIV/68081731:_____/03:12030029

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

Electron beam degradation study of silicon polymers.

Original language description

Excitation of organic molecules, polymers and molecular assemblies by electrons represents interesting phenomena from both the application (detectors on one side and electron resists on the other side) and the basic research point of view. The aim of this paper is to present the first steps of our cathodoluminescence (CL) study of the metastable states in poly-(methylphenylsilylene), i.e. PMPhSi.

Czech name

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Czech description

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Type

D - Article in proceedings

CEP classification

JA - Electronics and optoelectronics

OECD FORD branch

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Project

<a href="/en/project/GA202%2F01%2F0518" target="_blank" >GA202/01/0518: Metastability in organo-silicon hybrid structures with variable dimensionality</a><br>

Continuities

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year

2003

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection

Proceedings of the 6th Multinational Congress on Microscopy - European Extension.

ISBN

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ISSN

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e-ISSN

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Number of pages

2

Pages from-to

205-206

Publisher name

Croatian Society for Electron Microscopy

Place of publication

Zagreb

Event location

Pula [HR]

Event date

Jun 1, 2003

Type of event by nationality

EUR - Evropská akce

UT code for WoS article

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