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Hole transport in organic field-effect transistors with active poly(3-hexylthiophene) layer containing CdSe quantum dots

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61389013%3A_____%2F13%3A00392068" target="_blank" >RIV/61389013:_____/13:00392068 - isvavai.cz</a>

  • Result on the web

    <a href="http://dx.doi.org/10.2478/s13536-013-0101-0" target="_blank" >http://dx.doi.org/10.2478/s13536-013-0101-0</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.2478/s13536-013-0101-0" target="_blank" >10.2478/s13536-013-0101-0</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Hole transport in organic field-effect transistors with active poly(3-hexylthiophene) layer containing CdSe quantum dots

  • Original language description

    Hybrid field-effect transistors (FETs) based on poly(3-hexylthiophene) (P3HT) containing CdSe quantum dots (QDs) were fabricated. The effect of the concentration of QDs on charge transport in the hybrid material was studied. The influence of the QDs capping ligand on charge transport parameters was investigated by replacing the conventional trioctylphosphine oxide (TOPO) surfactant with pyridine to provide closer contact between the organic and inorganic components. Electrical parameters of FETs with anactive layer made of P3HT:CdSe QDs blend were determined, showing field-effect hole mobilities up to 1.1104 cm2/Vs. Incorporation of TOPO covered CdSe QDs decreased the charge carrier mobility while the pyridine covered CdSe QDs did not alter this transport parameter significantly.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

  • CEP classification

    CD - Macromolecular chemistry

  • OECD FORD branch

Result continuities

  • Project

  • Continuities

    Z - Vyzkumny zamer (s odkazem do CEZ)

Others

  • Publication year

    2013

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Materials Science-Poland

  • ISSN

    2083-1331

  • e-ISSN

  • Volume of the periodical

    31

  • Issue of the periodical within the volume

    2

  • Country of publishing house

    PL - POLAND

  • Number of pages

    10

  • Pages from-to

    288-297

  • UT code for WoS article

    000317956100020

  • EID of the result in the Scopus database