Thermal characterization of Se-Te thin films

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61389013%3A_____%2F15%3A00448477" target="_blank" >RIV/61389013:_____/15:00448477 - isvavai.cz</a>
Alternative codes found
RIV/00216275:25310/15:39900538
Result on the web
<a href="http://dx.doi.org/10.1016/j.jallcom.2015.04.161" target="_blank" >http://dx.doi.org/10.1016/j.jallcom.2015.04.161</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1016/j.jallcom.2015.04.161" target="_blank" >10.1016/j.jallcom.2015.04.161</a>

Result language
angličtina
Original language name
Thermal characterization of Se-Te thin films
Original language description
The thermal behavior of thin selenium?tellurium (Se?Te) films was studied under non-isothermal conditions using differential scanning calorimetry. The glass transition kinetics of the as-prepared thin films was found to change with increasing Te content;namely the activation energy of structural relaxation processes decreased from 355 to 245 kJ mol-1 of studiet films. In the glass-forming region the GFA criterion and relaxation data obtained for the thin films correlated very well with the results forbulk glasses. In the glass-forming region, the crystallization kinetics of thin films corresponded to that determined for very fine Se?Te powders.
Czech name
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Czech description
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Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
CA - Inorganic chemistry
OECD FORD branch
—

Project
<a href="/en/project/GAP106%2F11%2F1152" target="_blank" >GAP106/11/1152: Reversible crystallization and structural relaxation in amorphous materials used for phase change recording</a><br>
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Publication year
2015
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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