High resolution powder electron diffraction in scanning electron microscopy
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61389013%3A_____%2F21%3A00549414" target="_blank" >RIV/61389013:_____/21:00549414 - isvavai.cz</a>
Alternative codes found
RIV/68081731:_____/21:00549414
Result on the web
<a href="https://www.mdpi.com/1996-1944/14/24/7550" target="_blank" >https://www.mdpi.com/1996-1944/14/24/7550</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.3390/ma14247550" target="_blank" >10.3390/ma14247550</a>
Alternative languages
Result language
angličtina
Original language name
High resolution powder electron diffraction in scanning electron microscopy
Original language description
A modern scanning electron microscope equipped with a pixelated detector of transmitted electrons can record a four-dimensional (4D) dataset containing a two-dimensional (2D) array of 2D nanobeam electron diffraction patterns, this is known as a four-dimensional scanning transmission electron microscopy (4D-STEM). In this work, we introduce a new version of our method called 4D-STEM/PNBD (powder nanobeam diffraction), which yields high-resolution powder diffractograms, whose quality is fully comparable to standard TEM/SAED (selected-area electron diffraction) patterns. Our method converts a complex 4D-STEM dataset measured on a nanocrystalline material to a single 2D powder electron diffractogram, which is easy to process with standard software. The original version of 4D-STEM/PNBD method, which suffered from low resolution, was improved in three important areas: (i) an optimized data collection protocol enables the experimental determination of the point spread function (PSF) of the primary electron beam, (ii) an improved data processing combines an entropy-based filtering of the whole dataset with a PSF-deconvolution of the individual 2D diffractograms and (iii) completely re-written software automates all calculations and requires just a minimal user input. The new method was applied to Au, TbF3 and TiO2 nanocrystals and the resolution of the 4D-STEM/PNBD diffractograms was even slightly better than that of TEM/SAED.
Czech name
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Czech description
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Classification
Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
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OECD FORD branch
10404 - Polymer science
Result continuities
Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Others
Publication year
2021
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Materials
ISSN
1996-1944
e-ISSN
1996-1944
Volume of the periodical
14
Issue of the periodical within the volume
24
Country of publishing house
CH - SWITZERLAND
Number of pages
22
Pages from-to
7550
UT code for WoS article
000738730400001
EID of the result in the Scopus database
2-s2.0-85121290015