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4D-STEM-in-SEM: changing an SEM microscope to a user-friendly powder electron diffractometer

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61389013%3A_____%2F25%3A00636691" target="_blank" >RIV/61389013:_____/25:00636691 - isvavai.cz</a>

  • Alternative codes found

    RIV/68081731:_____/25:00636691 RIV/00216305:26210/26:0198572

  • Result on the web

    <a href="https://academic.oup.com/mam/article/31/3/ozaf045/8160210" target="_blank" >https://academic.oup.com/mam/article/31/3/ozaf045/8160210</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1093/mam/ozaf045" target="_blank" >10.1093/mam/ozaf045</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    4D-STEM-in-SEM: changing an SEM microscope to a user-friendly powder electron diffractometer

  • Original language description

    We describe recent improvements of our method named powder nanobeam diffraction in four-dimensional scanning transmission electron microscopy (4D-STEM/PNBD). The method can change an arbitrary SEM equipped with a 2D-array STEM detector to a user-friendly powder electron diffractometer. It reduces a 4D-STEM dataset to a single 2D powder electron diffraction pattern (using our Python package named STEMDIFF, https://pypi.org/project/stemdiff) and then to 1D radially averaged diffraction profile (using our Python package named EDIFF, https://pypi.org/project/ediff). Moreover, the EDIFF package can compare the final diffractogram with theoretically calculated X-ray diffraction patterns. Both STEMDIFF and EDIFF can be used in the form of simple interactive templates in Jupyter environment, which makes them accessible to common SEM users. The recent improvements in STEMDIFF and EDIFF (better dataset filtering, parallelization, and more flexible user interface) enabled us to analyze not only strongly diffracting nanocrystals but also samples with higher absorption and/or lower diffraction power. The final results obtained from 4D-STEM/PNBD datasets of all six samples analyzed in this contribution (two types of Au nanocrystals, GdF3 and TbF3 aggregates, and Fe3O4 nanoclusters with/without organic shell) were shown to be comparable with the results of the classical TEM/SAED method (selected area electron diffraction in TEM).

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database

  • CEP classification

  • OECD FORD branch

    10201 - Computer sciences, information science, bioinformathics (hardware development to be 2.2, social aspect to be 5.8)

Result continuities

  • Project

    Result was created during the realization of more than one project. More information in the Projects tab.

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Others

  • Publication year

    2025

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Microscopy and Microanalysis

  • ISSN

    1431-9276

  • e-ISSN

    1435-8115

  • Volume of the periodical

    31

  • Issue of the periodical within the volume

    3

  • Country of publishing house

    GB - UNITED KINGDOM

  • Number of pages

    14

  • Pages from-to

    ozaf045

  • UT code for WoS article

    001505505000001

  • EID of the result in the Scopus database

    2-s2.0-105008126580