Resolution limits of a single crystal scintillator based X-ray micro-radiography camera
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61389021%3A_____%2F20%3A00541071" target="_blank" >RIV/61389021:_____/20:00541071 - isvavai.cz</a>
Alternative codes found
RIV/68378271:_____/20:00541071
Result on the web
<a href="https://iopscience.iop.org/article/10.1088/1748-0221/15/02/C02014" target="_blank" >https://iopscience.iop.org/article/10.1088/1748-0221/15/02/C02014</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1088/1748-0221/15/02/C02014" target="_blank" >10.1088/1748-0221/15/02/C02014</a>
Alternative languages
Result language
angličtina
Original language name
Resolution limits of a single crystal scintillator based X-ray micro-radiography camera
Original language description
Recently, high resolution micro-radiography became of great interest. Very thin scintillator layers of about 5-20 micrometres are used to achieve spatial resolution below one micrometre in application for low energy X-ray micro-radiography [1]. Such thin screens are mainly used in micro-XCT and nano-XCT systems (X-ray Computed Tomography) with either micro-focus X-ray tubes or with synchrotron sources [2]. This work deals with a high-resolution CCD camera together with different optical systems and different single crystal scintillators in application for low energy X-ray micro-radiography. The light distribution on the screen is re-imaged by an optical system (usually represented by classical microscope objective together with a field lens) to a high-resolution CCD or CMOS chip. A theoretical modelling and practical comparison of a camera set-up has been done to investigate the system resolution limits. Thin screens were prepared from YAG:Ce scintillator. The resolution is presented on test patterns. As recent optical systems are limited to the classical microscopy objectives only, we further investigate a possibility to develop a custom-made objective fully dedicated to X-ray imaging application.
Czech name
—
Czech description
—
Classification
Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
—
OECD FORD branch
10306 - Optics (including laser optics and quantum optics)
Result continuities
Project
<a href="/en/project/EF16_026%2F0008390" target="_blank" >EF16_026/0008390: Partnership for excellence in superprecise optics</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Others
Publication year
2020
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Journal of Instrumentation
ISSN
1748-0221
e-ISSN
1748-0221
Volume of the periodical
15
Issue of the periodical within the volume
2
Country of publishing house
GB - UNITED KINGDOM
Number of pages
7
Pages from-to
C02014
UT code for WoS article
000527943500014
EID of the result in the Scopus database
2-s2.0-85081252227