On-chip digital holographic interferometry for measuring wavefront deformation in transparent samples
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61389021%3A_____%2F23%3A00574767" target="_blank" >RIV/61389021:_____/23:00574767 - isvavai.cz</a>
Alternative codes found
RIV/46747885:24220/23:00011122
Result on the web
<a href="https://opg.optica.org/oe/fulltext.cfm?uri=oe-31-11-17185&id=530478" target="_blank" >https://opg.optica.org/oe/fulltext.cfm?uri=oe-31-11-17185&id=530478</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1364/OE.486997" target="_blank" >10.1364/OE.486997</a>
Alternative languages
Result language
angličtina
Original language name
On-chip digital holographic interferometry for measuring wavefront deformation in transparent samples
Original language description
This paper describes on-chip digital holographic interferometry for measuring the wavefront deformation of transparent samples. The interferometer is based on a Mach-Zehnder arrangement with a waveguide in the reference arm, which allows for a compact on-chip arrangement. The method thus exploits the sensitivity of digital holographic interferometry and the advantages of the on-chip approach, which provides high spatial resolution over a large area, simplicity, and compactness of the system. The method's performance is demonstrated by measuring a model glass sample fabricated by depositing SiO2 layers of different thicknesses on a planar glass substrate and visualizing the domain structure in periodically poled lithium niobate. Finally, the results of the measurement made with the on-chip digital holographic interferometer were compared with those made with a conventional Mach-Zehnder type digital holographic interferometer with lens and with a commercial white light interferometer. The comparison of the obtained results indicates that the on-chip digital holographic interferometer provides accuracy comparable to conventional methods while offering the benefits of a large field of view and simplicity.
Czech name
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Czech description
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Classification
Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
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OECD FORD branch
10306 - Optics (including laser optics and quantum optics)
Result continuities
Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Others
Publication year
2023
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Optics Express
ISSN
1094-4087
e-ISSN
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Volume of the periodical
31
Issue of the periodical within the volume
11
Country of publishing house
US - UNITED STATES
Number of pages
16
Pages from-to
17185-17200
UT code for WoS article
001012041500004
EID of the result in the Scopus database
2-s2.0-85163164021