Direct LiF imaging diagnostics on refractive X-ray focusing at the EuXFEL High Energy Density instrument
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61389021%3A_____%2F23%3A00582700" target="_blank" >RIV/61389021:_____/23:00582700 - isvavai.cz</a>
Alternative codes found
RIV/68378271:_____/23:00568523
Result on the web
<a href="https://scripts.iucr.org/cgi-bin/paper?S1600577522006245" target="_blank" >https://scripts.iucr.org/cgi-bin/paper?S1600577522006245</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1107/S1600577522006245" target="_blank" >10.1107/S1600577522006245</a>
Alternative languages
Result language
angličtina
Original language name
Direct LiF imaging diagnostics on refractive X-ray focusing at the EuXFEL High Energy Density instrument
Original language description
The application of fluorescent crystal media in wide-range X-ray detectors provides an opportunity to directly image the spatial distribution of ultra-intense X-ray beams including investigation of the focal spot of free-electron lasers. Here the capabilities of the micro- and nano-focusing X-ray refractive optics available at the High Energy Density instrument of the European XFEL are reported, as measured in situ by means of a LiF fluorescent detector placed into and around the beam caustic. The intensity distribution of the beam focused down to several hundred nanometers was imaged at 9 keV photon energy. A deviation from the parabolic surface in a stack of nanofocusing Be compound refractive lenses (CRLs) was found to affect the resulting intensity distribution within the beam. Comparison of experimental patterns in the far field with patterns calculated for different CRL lens imperfections allowed the overall inhomogeneity in the CRL stack to be estimated. The precise determination of the focal spot size and shape on a sub-micrometer level is essential for a number of high energy density studies requiring either a pin-size backlighting spot or extreme intensities for X-ray heating.
Czech name
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Czech description
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Classification
Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
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OECD FORD branch
10306 - Optics (including laser optics and quantum optics)
Result continuities
Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Others
Publication year
2023
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Journal of Synchrotron Radiation
ISSN
0909-0495
e-ISSN
1600-5775
Volume of the periodical
30
Issue of the periodical within the volume
January
Country of publishing house
GB - UNITED KINGDOM
Number of pages
9
Pages from-to
208-216
UT code for WoS article
000908417600019
EID of the result in the Scopus database
2-s2.0-85145536582