Dielectric Response and Low Dielectric Loss of Gadolinium-Doped CaCu3Ti4O12Ceramics Processed Through Conventional and Microwave Sintering
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61389021%3A_____%2F23%3A00583134" target="_blank" >RIV/61389021:_____/23:00583134 - isvavai.cz</a>
Result on the web
<a href="https://link.springer.com/article/10.1007/s11664-023-10341-w" target="_blank" >https://link.springer.com/article/10.1007/s11664-023-10341-w</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1007/s11664-023-10341-w" target="_blank" >10.1007/s11664-023-10341-w</a>
Alternative languages
Result language
angličtina
Original language name
Dielectric Response and Low Dielectric Loss of Gadolinium-Doped CaCu3Ti4O12Ceramics Processed Through Conventional and Microwave Sintering
Original language description
Gadolinium-doped (CaCu3Ti4O12/CCTO)x ceramics were fabricated using conventional (CS) and microwave sintering (MWS) at x = 0.1, 0.2 and 0.3. The green compacts were sintered at 1100°C via muffle and microwave furnace at 5°C min−1/12 h and 50°C min−1/30 min, respectively. A single pure cubic phase of CCTO for MWS and minor secondary phases for CS were revealed by x-ray diffraction (XRD) patterns. Scanning electron microscope (SEM) images showed a reduction in grain size from ~ 20.04 ± 8.43 µm to ~ 17.52 ± 7.77 µm and ~ 1.99 ± 0.44 µm to ~ 1.32 ± 0.27 µm for both CS and MWS. The charge carrier hopping between Cu+ and Ti3+ was probed using x-ray photoelectron spectroscopy (XPS), which confirmed the conductivity of grains and internal barrier layer capacitance (IBLC) effect. Broadband dielectric spectrometer findings revealed a dielectric constant of ɛ > 104 at 10 Hz and ɛ > 103 at 100 kHz for CS at x = 0.2 and ɛ > 102 at 10 Hz (x ≤ 0.2) for MWS. A very minimal tanδ of 0.08 (x = 0.2) was recorded at 100 kHz.
Czech name
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Czech description
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Classification
Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
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OECD FORD branch
20504 - Ceramics
Result continuities
Project
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Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Others
Publication year
2023
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Journal of Electronic Materials
ISSN
0361-5235
e-ISSN
1543-186X
Volume of the periodical
52
Issue of the periodical within the volume
6
Country of publishing house
DE - GERMANY
Number of pages
11
Pages from-to
3848-3858
UT code for WoS article
000961215400002
EID of the result in the Scopus database
2-s2.0-85151360341