Heat-induced variation of second-harmonic generation in silicon oxynitride thin films
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61389021%3A_____%2F23%3A00584197" target="_blank" >RIV/61389021:_____/23:00584197 - isvavai.cz</a>
Alternative codes found
RIV/46747885:24220/23:00011512
Result on the web
<a href="https://ieeexplore.ieee.org/document/10232676" target="_blank" >https://ieeexplore.ieee.org/document/10232676</a>
DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Heat-induced variation of second-harmonic generation in silicon oxynitride thin films
Original language description
Fluorescence lifetime imaging (FLIM) is an indispensable tool for many fields, including material research or biophysics. Therefore, the search for a new robust and low-cost method for FLIM is of high interest. We present a novel RAndom Temporal Signals (RATS) method for FLIM. The RATS technique reaches a higher signal-to-noise ratio (SNR) compared to conventional time-resolved methods due to continuous random excitation. Moreover, it eliminates the need to choose the correct repetition pulse rate and avoids additional signal timing.
Czech name
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Czech description
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Classification
Type
O - Miscellaneous
CEP classification
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OECD FORD branch
10306 - Optics (including laser optics and quantum optics)
Result continuities
Project
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Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Others
Publication year
2023
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů