Finding similarities in laser micrometers scanned data using cross-covariance

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61989100%3A27230%2F19%3A10242397" target="_blank" >RIV/61989100:27230/19:10242397 - isvavai.cz</a>
Result on the web
<a href="http://dx.doi.org/10.1109/CarpathianCC.2019.8766054" target="_blank" >http://dx.doi.org/10.1109/CarpathianCC.2019.8766054</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1109/CarpathianCC.2019.8766054" target="_blank" >10.1109/CarpathianCC.2019.8766054</a>

Result language
angličtina
Original language name
Finding similarities in laser micrometers scanned data using cross-covariance
Original language description
This paper demonstrates a signal processing approach designed to overlay data sets measured using two optical micrometers. Two sensors are used in order to measure object's shape, but measured signals are relatively shifted, because it is impossible to mount sensors into the same position. Covariance method are applied to measurement data and the shift between these sets are evaluated. (C) 2019 IEEE.
Czech name
—
Czech description
—

Project
<a href="/en/project/EF16_019%2F0000867" target="_blank" >EF16_019/0000867: Research Centre of Advanced Mechatronic Systems</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>S - Specificky vyzkum na vysokych skolach

Publication year
2019
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection
Proceedings of the 2019 20th International Carpathian Control Conference, ICCC 2019
ISBN
978-1-72810-701-1
ISSN
—
e-ISSN
—
Number of pages
4
Pages from-to
201-204
Publisher name
Institute of Electrical and Electronics Engineers Inc.
Place of publication
Piscataway, New Jersey, USA
Event location
Krakow - Wieliczka
Event date
May 26, 2019
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
000490570500044

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