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BK-ELCOM and PAQNET - suite of NI-based SW and HW products for Power Quality Monitoring

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61989100%3A27240%2F04%3A00010707" target="_blank" >RIV/61989100:27240/04:00010707 - isvavai.cz</a>

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    BK-ELCOM and PAQNET - suite of NI-based SW and HW products for Power Quality Monitoring

  • Original language description

    Developing complete SW and HW solution for PC based power quality monitoring network. The complete SW includes the power quality analyzer firmware in compliance with IEC and EN power quality standards, client-server based post-processing, complex tool for remote setup, remote monitoring and remote post-processing of multiple power quality analyzers and Web-based post-processing. Developing a concept of power quality analyzer network, independent on type of instrument or instrument#s connection. Developing a new IVI Class for power analyzers# IviPwrAn class. Developing a set of applications for operation and maintenance of power acquisition network.

  • Czech name

    BK-ELCOM and PAQNET - suite of NI-based SW and HW products for Power Quality Monitoring

  • Czech description

    Developing complete SW and HW solution for PC based power quality monitoring network. The complete SW includes the power quality analyzer firmware in compliance with IEC and EN power quality standards, client-server based post-processing, complex tool for remote setup, remote monitoring and remote post-processing of multiple power quality analyzers and Web-based post-processing. Developing a concept of power quality analyzer network, independent on type of instrument or instrument#s connection. Developing a new IVI Class for power analyzers# IviPwrAn class. Developing a set of applications for operation and maintenance of power acquisition network.

Classification

  • Type

    M - Conference organization

  • CEP classification

    JA - Electronics and optoelectronics

  • OECD FORD branch

Result continuities

  • Project

  • Continuities

    Z - Vyzkumny zamer (s odkazem do CEZ)

Others

  • Publication year

    2004

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Event location

    Austin, Texas, USA, us

  • Event country

    US - UNITED STATES

  • Event starting date

  • Event ending date

  • Total number of attendees

    200

  • Foreign attendee count

    100

  • Type of event by attendee nationality

    WRD - Celosvětová akce