CompactRIO Embedded System in Power Quality Analysis
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61989100%3A27240%2F08%3A00021124" target="_blank" >RIV/61989100:27240/08:00021124 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
CompactRIO Embedded System in Power Quality Analysis
Original language description
Electrical measurement department of VSB-Technical University is involved for more than 14 years in research and development of Power Quality Analyzer built on Virtual Instrumentation Technology. PC-based power quality analyzer with National Instrumentsdata acquisition board was designed and developed. National Instruments LabVIEW is used as the development environment for all parts of power quality analyzer software. Proved PC-based firmware was ported to new hardware platform for virtual instrumentation ? National Instruments CompactRIO at the end of 2007. Platform change from PC to cRIO is not just code recompilation, but it brings many specific software changes. In comparison with PC-based instruments brings cRIO-based power quality analyzer morerobust and reliable compact instrument with small size, real-time operating system, wide operating temperature and very low power consumption.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
<a href="/en/project/1M0567" target="_blank" >1M0567: Centre for Applied Cybernetics</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Others
Publication year
2008
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
INTERNATIONAL MULTICONFERENCE ON COMPUTER SCIENCE AND INFORMATION TECHNOLOGY (IMCSIT), VOLS 1 AND 2
ISBN
978-83-60810-14-9
ISSN
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e-ISSN
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Number of pages
4
Pages from-to
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Publisher name
IEEE, 345 E 47TH ST, NEW YORK, NY 10017 USA
Place of publication
NEW YORK
Event location
Wisla, POLAND
Event date
Oct 20, 2008
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
000268848500084