Surface Plasmon Resonance Based Measurement of the Dielectric Function of a Thin Metal Film

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61989100%3A27240%2F18%3A10239569" target="_blank" >RIV/61989100:27240/18:10239569 - isvavai.cz</a>

Result on the web

<a href="https://www.mdpi.com/1424-8220/18/11/3693" target="_blank" >https://www.mdpi.com/1424-8220/18/11/3693</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.3390/s18113693" target="_blank" >10.3390/s18113693</a>

Result language

angličtina

Original language name

Surface Plasmon Resonance Based Measurement of the Dielectric Function of a Thin Metal Film

Original language description

A spectral method based on surface plasmon resonance (SPR) in air is used to measure the dielectric function of a thin metal film. The method utilizes the spectral dependence of the ratio of the reflectances of p- and s-polarized waves measured in the Kretschmann configuration at different angles of incidence. By processing these dependences in the vicinity of a dip, or equivalently near the resonance wavelength, and using the dispersion characteristics of a metal film according to a proposed physical model, the real and imaginary parts of the dielectric function of the metal can be determined. The corresponding dielectric function of the metal is obtained by a least squares method for such a thickness minimizing the difference between the measured and theoretical dependence of the resonance wavelength on the the angle of incidence. The feasibility of the method is demonstrated in measuring the dielectric function of a gold film of an SPR structure comprising an SF10 glass prism and a gold coated SF10 slide with an adhesion film of chromium. The dielectric function according to the Drude-Lorentz model with two additional Lorentzian terms was determined in a wavelength range from 534 to 908 nm, and the results show that the gold film is composed of homogenous and rough layers with thicknesses 42.8 nm and 2.0 nm, respectively. This method is particularly useful in measuring the thickness and dielectric function of a thin metal film of SPR structures, directly in the Kretschmann configuration.

Czech name

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Czech description

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Type

J_imp - Article in a specialist periodical, which is included in the Web of Science database

CEP classification

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OECD FORD branch

10306 - Optics (including laser optics and quantum optics)

Project

<a href="/en/project/EF17_048%2F0007399" target="_blank" >EF17_048/0007399: New Composite Materials for Environmental Applications</a><br>

Continuities

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>S - Specificky vyzkum na vysokych skolach

Publication year

2018

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Sensors

ISSN

1424-3210

e-ISSN

—

Volume of the periodical

18

Issue of the periodical within the volume

11

Country of publishing house

CH - SWITZERLAND

Number of pages

12

Pages from-to

"3693(1)"-"3693(12)"

UT code for WoS article

000451598900103

EID of the result in the Scopus database

2-s2.0-85055837112