Analysis and modeling of secondary X-ray effect on structure of skiagraphy images

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61989100%3A27240%2F18%3A10241598" target="_blank" >RIV/61989100:27240/18:10241598 - isvavai.cz</a>

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

Analysis and modeling of secondary X-ray effect on structure of skiagraphy images

Original language description

Secondary X-ray effect is a significant phenomenon which is linked with the X-ray imaging. Besides an impact on the human organism, it may significantly influence recording devices such as the skiagraphy images. During the RTG irradiation, the secondary X-ray is being distributed to its surrounding, and may affect skiagraphy images which are stored in the clinical workplace. The secondary irradiation causes a partially irreversible deterioration resulting to a worse quality of the clinical information. More times is particular image affected by the secondary X-ray, we obtain a worse quality and reproducibility of the clinical information. Unfortunately, there is not clinically objective approach for determining the X-ray effect level before using particular skiagraphy image. We have done analysis and modelling of the secondary X-ray effect on skiagraphy records within several experiments. A level of the X-ray irradiation is being modelled via the multiregional segmentation method allowing for extraction image areas affected by irradiation. Consequently, this model allows for a calculation of image features representing the irradiation level, and estimates a quantification of the secondary X-ray irradiation. Copyright (C) 2018 by SCITEPRESS - Science and Technology Publications, Lda. All rights reserved

Czech name

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Czech description

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Type

D - Article in proceedings

CEP classification

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OECD FORD branch

10201 - Computer sciences, information science, bioinformathics (hardware development to be 2.2, social aspect to be 5.8)

Project

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Continuities

S - Specificky vyzkum na vysokych skolach

Publication year

2018

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection

BIODEVICES 2018 - 11th International Conference on Biomedical Electronics and Devices, Proceedings; Part of 11th International Joint Conference on Biomedical Engineering Systems and Technologies, BIOSTEC 2018

ISBN

978-989-758-277-6

ISSN

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e-ISSN

neuvedeno

Number of pages

10

Pages from-to

30-38

Publisher name

SciTePress - Science and Technology Publications

Place of publication

Setúbal

Event location

Funchal

Event date

Jan 19, 2018

Type of event by nationality

WRD - Celosvětová akce

UT code for WoS article

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