Analysis of EMC Factors on Electronic Devices Using PLS-SEM Method: A Case Study in Vietnam

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61989100%3A27240%2F23%3A10253817" target="_blank" >RIV/61989100:27240/23:10253817 - isvavai.cz</a>

Result on the web

<a href="https://www.mdpi.com/2076-3417/13/2/1005" target="_blank" >https://www.mdpi.com/2076-3417/13/2/1005</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.3390/app13021005" target="_blank" >10.3390/app13021005</a>

Result language

angličtina

Original language name

Analysis of EMC Factors on Electronic Devices Using PLS-SEM Method: A Case Study in Vietnam

Original language description

Electronic equipment is indispensable in the industrial 4.0 era. Electromagnetic Compatibility issues with electronic devices are increasingly concerning. The phenomenon of electromagnetic field compatibility is getting higher and higher. The operating quality of electronic equipment is more and more adversely affected, such as by the phenomenon of hesitation in operation for the operating structures, the generation of fire and explosion of electrical equipment, the loss of information, and many other negative effects. This paper discusses the relationship between Electromagnetic Compatibility (EMC) scoring, Electromagnetic Interference (EMI) scoring, and Electromagnetic Susceptibility (EMS) scoring with the performance quality of electronic devices (QUA). We perform reviews on regulatory institutions governing Electromagnetic Compatibility on electronic devices. To evaluate the proposed Electromagnetic Compatibility structure and its relationship to electronic devices, we proposed to use the Partial Least Squares Structural Equation Modeling (PLS-SEM) method. The research results of the model show that the electronic device layout conditions and the lack of systematic conditions have a negative impact on the operating quality of the electronic equipment, while the conditions on equipment techniques, scientific and technological resources have positive and significant impacts.

Czech name

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Czech description

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Type

J_imp - Article in a specialist periodical, which is included in the Web of Science database

CEP classification

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OECD FORD branch

20201 - Electrical and electronic engineering

Project

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Continuities

S - Specificky vyzkum na vysokych skolach

Publication year

2023

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Applied Sciences

ISSN

2076-3417

e-ISSN

2076-3417

Volume of the periodical

13

Issue of the periodical within the volume

2

Country of publishing house

CH - SWITZERLAND

Number of pages

27

Pages from-to

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UT code for WoS article

000914372200001

EID of the result in the Scopus database

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