Spectral interferometric technique to measure the ellipsometric phase of a thin-film structure
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61989100%3A27350%2F09%3A00021702" target="_blank" >RIV/61989100:27350/09:00021702 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Spectral interferometric technique to measure the ellipsometric phase of a thin-film structure
Original language description
A white-light spectral interferometric technique is used to retrieve the ellipsometric phase of a thin-film structure.
Czech name
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Czech description
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Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
BH - Optics, masers and lasers
OECD FORD branch
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Result continuities
Project
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Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2009
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Optics Letters
ISSN
0146-9592
e-ISSN
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Volume of the periodical
34
Issue of the periodical within the volume
17
Country of publishing house
US - UNITED STATES
Number of pages
3
Pages from-to
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UT code for WoS article
000270114400041
EID of the result in the Scopus database
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