Maxima of the spectral reflectance ratio of polarized waves used to measure the thickness of a nonabsorbing thin film
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61989100%3A27350%2F10%3A10225422" target="_blank" >RIV/61989100:27350/10:10225422 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Maxima of the spectral reflectance ratio of polarized waves used to measure the thickness of a nonabsorbing thin film
Original language description
A simple method to determine the thickness of a nonabsorbing thin film on an absorbing substrate from maxima of the spectral reflectance ratio is presented.
Czech name
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Czech description
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Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
BH - Optics, masers and lasers
OECD FORD branch
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Result continuities
Project
<a href="/en/project/ED0040%2F01%2F01" target="_blank" >ED0040/01/01: Regional materials science and technology centre</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2010
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Optics and lasers in Engineering
ISSN
0143-8166
e-ISSN
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Volume of the periodical
48
Issue of the periodical within the volume
7-8
Country of publishing house
NL - THE KINGDOM OF THE NETHERLANDS
Number of pages
6
Pages from-to
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UT code for WoS article
000278176700011
EID of the result in the Scopus database
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