Spectral interferometric technique to measure the relative phase change on reflection from a thin-film structure
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61989100%3A27350%2F10%3A10228189" target="_blank" >RIV/61989100:27350/10:10228189 - isvavai.cz</a>
Result on the web
—
DOI - Digital Object Identifier
—
Alternative languages
Result language
angličtina
Original language name
Spectral interferometric technique to measure the relative phase change on reflection from a thin-film structure
Original language description
A two-step white-light spectral interferometric technique to measure the relative phase change on reflection from a thin-film structure is presented.
Czech name
—
Czech description
—
Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
BH - Optics, masers and lasers
OECD FORD branch
—
Result continuities
Project
<a href="/en/project/ED0040%2F01%2F01" target="_blank" >ED0040/01/01: Regional materials science and technology centre</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2010
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
APPLIED PHYSICS B-LASERS AND OPTICS
ISSN
0946-2171
e-ISSN
—
Volume of the periodical
101
Issue of the periodical within the volume
4
Country of publishing house
US - UNITED STATES
Number of pages
5
Pages from-to
—
UT code for WoS article
000284771400021
EID of the result in the Scopus database
—