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Application of infrared ATR ellipsometry for measurement of solid samples: Calibration procedure

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61989100%3A27360%2F11%3A86080393" target="_blank" >RIV/61989100:27360/11:86080393 - isvavai.cz</a>

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    Application of infrared ATR ellipsometry for measurement of solid samples: Calibration procedure

  • Original language description

    Attenuated total reflection (ATR) is widely used in infrared spectral range for measurement of surface properties of solid samples, powders, and liquids. In this paper we use a commercial Fourier-transform infrared (FTIR) spectrometer Vertex 70v from Bruker company equipped with the ATR Golden Gate accessory from Specac. To increase sensitivity of the method we included infrared polarizer and analyzer, which enable measurement of the reflected amplitudes ratio and the phase differences between p- and s-polarizations in the frame of the ATR ellipsometry. Procedure of ellipsometric angles measurement is proposed using data acquisition at several azimuthal angles of polarizers. Spectral dependence of real polarizer extinction ratio, partial polarization of beam coming from the interferometer and polarization sensitivity of infrared detector are presented.

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    BH - Optics, masers and lasers

  • OECD FORD branch

Result continuities

  • Project

    Result was created during the realization of more than one project. More information in the Projects tab.

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)

Others

  • Publication year

    2011

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    Photonics, Devices, and Systems V : conference proceedings : 24-26 August 2011, Prague, Czech Republic

  • ISBN

    978-0-8194-8953-1

  • ISSN

    0277-786X

  • e-ISSN

  • Number of pages

    7

  • Pages from-to

    "83060S"

  • Publisher name

    SPIE

  • Place of publication

    Bellingham

  • Event location

    Praha

  • Event date

    Aug 24, 2011

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article

    000297582500028