The Role of Atomic Force Microscopy in Nanoparticle Research

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61989592%3A15310%2F10%3A10211985" target="_blank" >RIV/61989592:15310/10:10211985 - isvavai.cz</a>

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

The Role of Atomic Force Microscopy in Nanoparticle Research

Original language description

Nanoparticles include any type of a particle with three dimensions of less than 100 nanometers. The study of such nanoparticles requires powerful microscopic techniques. In recent 20 years, the classical method, electron microscopy, was accompanied by another method, atomic force microscopy, based on scanning the sample with a sharp tip moving at a small distance above the sample. In comparison with electron microscopy, the application of atomic force microscopy offers the capability of three-imensionalvisualization and enables to get information on size and morpohology. However, there are often some deteriorations, a convolution being the most important one. In this review, we try to resume diverse applications, where atomic force microscopy was usedto support a research of nanoparticles. Not only showing the range of applications, we highlight scopes, where atomic force microscopy exceeds electron microscopy methods and also draw attention to problems of atomic force microscopy ima

Czech name

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Czech description

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Type

J_x - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

CEP classification

BM - Solid-state physics and magnetism

OECD FORD branch

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Project

<a href="/en/project/1M0512" target="_blank" >1M0512: Research center of powdered nanomaterials</a><br>

Continuities

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year

2010

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Journal of Advanced Microscopy Research

ISSN

2156-7573

e-ISSN

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Volume of the periodical

5

Issue of the periodical within the volume

2

Country of publishing house

US - UNITED STATES

Number of pages

11

Pages from-to

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UT code for WoS article

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EID of the result in the Scopus database

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