Nanoscratch test - A tool for evaluation of cohesive and adhesive properties of thin films and coatings

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61989592%3A15310%2F13%3A33145368" target="_blank" >RIV/61989592:15310/13:33145368 - isvavai.cz</a>

Result on the web

<a href="http://dx.doi.org/10.1051/epjconf/20134800027" target="_blank" >http://dx.doi.org/10.1051/epjconf/20134800027</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1051/epjconf/20134800027" target="_blank" >10.1051/epjconf/20134800027</a>

Result language

angličtina

Original language name

Nanoscratch test - A tool for evaluation of cohesive and adhesive properties of thin films and coatings

Original language description

Thin films and coatings play an essential role in the whole range of applications. The example par excellence are optical thin films that broaden the possibilities of design of optical components. Analogically to other applications of thin films their mechanical properties are very important for their successful applicability and reliability. This becomes especially vital when they are employed in rough service conditions. As thin films on substrates inherently create a compact system the strength of the film-substrate interface is of great importance. Several experimental methods have been developed for qualification and quantification of the mechanical stability of the film-substrate system. In this paper, some brief introduction into the nanoscratchtest is introduced. It is currently the most widely used method to evaluate and to test cohesive-adhesive properties of thin films and coatings.

Czech name

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Czech description

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Type

J_x - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

CEP classification

JL - Fatigue and fracture mechanics

OECD FORD branch

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Project

Result was created during the realization of more than one project. More information in the Projects tab.

Continuities

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>S - Specificky vyzkum na vysokych skolach

Publication year

2013

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

EPJ Web of Conferences

ISSN

2100-014X

e-ISSN

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Volume of the periodical

48

Issue of the periodical within the volume

N.

Country of publishing house

FR - FRANCE

Number of pages

4

Pages from-to

"00027-1"-"00027-4"

UT code for WoS article

000326985500026

EID of the result in the Scopus database

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