Vortex topographic microscopy for full-field reference-free imaging and testing

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61989592%3A15310%2F17%3A73581722" target="_blank" >RIV/61989592:15310/17:73581722 - isvavai.cz</a>

Alternative codes found

RIV/00216305:26620/17:PU124310

Result on the web

<a href="https://www.osapublishing.org/oe/fulltext.cfm?uri=oe-25-18-21428&id=371047" target="_blank" >https://www.osapublishing.org/oe/fulltext.cfm?uri=oe-25-18-21428&id=371047</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1364/OE.25.021428" target="_blank" >10.1364/OE.25.021428</a>

Result language

angličtina

Original language name

Vortex topographic microscopy for full-field reference-free imaging and testing

Original language description

Light vortices carry orbital angular momentum and have a variety of applications in optical manipulation, high-capacity communications or microscopy. Here we propose a new concept of full-field vortex topographic microscopy enabling a reference-free displacement and shape measurement of reflective samples. The sample surface is mapped by an array of light spots enabling quantitative reconstruction of the local depths from defocused wavefronts. Light from the spots is converted to a lattice of mutually uncorrelated doublehelix point spread functions (PSFs) whose angular rotation enables depth estimation. The PSFs are created by self-interference of optical vortices that originate from the same wavefront and are shaped by a spiral phase mask (SPM). The method benefits from the isoplanatic PSFs whose shape and size remain unchanged under defocusing, ensuring high precision in a wide range of measured depths. The technique was tested using a microscope Nikon Eclipse E600 working with a micro-hole plate providing structured illumination and the SPM placed in the imaging path. The depth measurement was demonstrated in the range of 11 mu m exceeding the depth of field of the microscope objective up to 19 times. Throughout this range, the surface depth was mapped with the precision better than 30 nm at the lateral positions given with the precision better than 10 nm. Application potential of the method was demonstrated by profiling the top surface of a bearing ball and reconstructing the threedimensional relief of a reflection phase grating.

Czech name

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Czech description

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Type

J_imp - Article in a specialist periodical, which is included in the Web of Science database

CEP classification

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OECD FORD branch

10306 - Optics (including laser optics and quantum optics)

Project

Result was created during the realization of more than one project. More information in the Projects tab.

Continuities

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year

2017

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Optics Express

ISSN

1094-4087

e-ISSN

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Volume of the periodical

25

Issue of the periodical within the volume

18

Country of publishing house

US - UNITED STATES

Number of pages

16

Pages from-to

21428-21443

UT code for WoS article

000411529000043

EID of the result in the Scopus database

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