Analysis of painting materials on multimodal microscopic level
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F67985556%3A_____%2F10%3A00342149" target="_blank" >RIV/67985556:_____/10:00342149 - isvavai.cz</a>
Alternative codes found
RIV/61388980:_____/10:00342149 RIV/60461446:52810/10:#0000080
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Analysis of painting materials on multimodal microscopic level
Original language description
Our paper introduces a system based on digital image processing algorithms designed to facilitate analysis of painting materials during artwork conservation. Microscopic images of minute samples - cross sections ? from the artworks are scanned using visible and ultraviolet spectra and under scanning electron microscope. Firstly, the scans are registered to remove geometrical differences. The multimodal nature of the problem led to the application of mutual information. The image quality is maximized bymeans of blind deconvolution methods. Cross-sections are then segmented to individual layers and distinctive seeds. For the image retrieval part, which facilitates further analyzes and conclusions, the layers are represented by means of wavelet analysisand secondorder statistics. The library of such features can be connected to the time of creation and differences between vectors of the same materials but from different paintings can help during a painter authentication.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
JC - Computer hardware and software
OECD FORD branch
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Result continuities
Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2010
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Proceedings of SPIE IS&T/SPIE Electronic Imaging 2010
ISBN
978-0-8194-7924-2
ISSN
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e-ISSN
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Number of pages
9
Pages from-to
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Publisher name
SPIE
Place of publication
San Jose
Event location
San Jose
Event date
Jan 17, 2010
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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