Advanced textural representation of materials appearance
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F67985556%3A_____%2F11%3A00369913" target="_blank" >RIV/67985556:_____/11:00369913 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Advanced textural representation of materials appearance
Original language description
Multidimensional visual texture is the appropriate paradigm for physically correct material visual properties representation. The course will present recent advances in texture modelling methodology as applied in computer vision, pattern recognition, computer graphics, and virtual/augmented reality applications. Contrary to previous courses on material appearance, we will focus on materials whose nature allows the exploitation of texture modeling approaches. This topic is introduced in the wider and complete context of pattern recognition and image rocessing. It comprehends modeling of multi-spectral images and videos which can be accomplished either with multi-dimensional mathematical models or sophisticated sampling methods from the original measurements. The key aspects of the topic, i.e., different multi-dimensional data models with their corresponding benefits and drawbacks, optimal model selection, parameter estimation and model synthesis techniques, are discussed.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
BD - Information theory
OECD FORD branch
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Result continuities
Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2011
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Proceedings of SA '11 SIGGRAPH Asia 2011 Courses
ISBN
978-1-4503-1135-9
ISSN
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e-ISSN
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Number of pages
84
Pages from-to
1-84
Publisher name
ACM
Place of publication
New York
Event location
Hong Kong
Event date
Dec 12, 2011
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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