BRDF Interpolation using Anisotropic Stencils
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F67985556%3A_____%2F16%3A00457068" target="_blank" >RIV/67985556:_____/16:00457068 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
BRDF Interpolation using Anisotropic Stencils
Original language description
Fast and reliable measurement of material appearance is crucial for many applications ranging from virtual prototyping to visual quality control. The most common appearance representation is BRDF capturing illumination- and viewing-dependent reflectance. One of the approaches to rapid BRDF measurement captures its subspace, using so called slices, by continuous movements of a light and camera in azimuthal directions, while their elevations remain fixed. This records set of slices in the BRDF space while remaining data are unknown. We present a novel approach to BRDF reconstruction based on a concept of anisotropic stencils interpolating values along predicted locations of anisotropic highlights. Our method marks an improvement over the original linear interpolation method, and thus we ascertain it to be a promising variant of interpolation from such sparse yet very effective measurements.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
BD - Information theory
OECD FORD branch
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Result continuities
Project
<a href="/en/project/GA14-02652S" target="_blank" >GA14-02652S: Advanced measurement of material appearance</a><br>
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Others
Publication year
2016
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
IS&T International Symposium on Electronic Imaging 2016
ISBN
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ISSN
2470-1173
e-ISSN
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Number of pages
6
Pages from-to
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Publisher name
Society for Imaging Science and Technology
Place of publication
Springfield
Event location
San Francisco
Event date
Feb 14, 2016
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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