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Voltage-step Transient in Redox Systems III. Effect of the Current Primary Distribution via Nernst Model

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F67985858%3A_____%2F10%3A00360483" target="_blank" >RIV/67985858:_____/10:00360483 - isvavai.cz</a>

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    Voltage-step Transient in Redox Systems III. Effect of the Current Primary Distribution via Nernst Model

  • Original language description

    In addition to the common transient diffusion (Cottrell), there are further transport results that cannot be neglected: Faradic resistance at surface of the working electrode, and Ohmic resistance in the bulk of streaming electrolyte solution between theworking and counter electrodes. These additional resistances are analyzed here for the voltage-step transient (VST) process using the Nernst model of a two-electrode cell (no reference electrode). The Faradic resistance is considered for a single redoxcouple O + ne- = R according to Butler-Volmer electrode kinetics. The effect of Ohmic and Faradic resistances in VST is accounted for using two models: the recently updated 1D approximation and a new model that accepts primary current distribution for acircular electrode. It is shown that the 1D approximation introduces unacceptable errors.

  • Czech name

  • Czech description

Classification

  • Type

    O - Miscellaneous

  • CEP classification

    CI - Industrial chemistry and chemical engineering

  • OECD FORD branch

Result continuities

  • Project

    <a href="/en/project/GA104%2F08%2F0428" target="_blank" >GA104/08/0428: Effect of the surface roughness, ohmic resistance, and electrode kinetics on autocalibration of electrodiffusion friction probes</a><br>

  • Continuities

    Z - Vyzkumny zamer (s odkazem do CEZ)

Others

  • Publication year

    2010

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů