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Lifetime on carriers and seebeck coefficient in semiconductors

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F67985882%3A_____%2F04%3A00105958" target="_blank" >RIV/67985882:_____/04:00105958 - isvavai.cz</a>

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    Lifetime on carriers and seebeck coefficient in semiconductors

  • Original language description

    The lifetime of carriers represents an important parameter of radiation detectors which is characteristic for them. Usually the current experimental technique for their measurement makes use of different experimental methods, as photoconductivity. Very often the product of mobility and lifetime is introduced as a criterion for the semiconductor suitability of radiation detection.

  • Czech name

    Doba života nosičů náboje a Seebeckův koeficient v polovodičích

  • Czech description

    Doba života nosičů náboje je důležitým parametrem radiačních detektorů, která je pro ně charakteristická. Mezi různé metodiky měření této veličiny patří obyčejně používaná metodika měření fotovodivosti. Součin pohyblivosti a doby života je známý jako kritérium vhodnosti polovodičů pro detektory záření.

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    JB - Sensors, detecting elements, measurement and regulation

  • OECD FORD branch

Result continuities

  • Project

    Result was created during the realization of more than one project. More information in the Projects tab.

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Others

  • Publication year

    2004

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    Proceedings of WORKSHOP 2004

  • ISBN

    80-01-02945-X

  • ISSN

  • e-ISSN

  • Number of pages

    2

  • Pages from-to

    122-123

  • Publisher name

    Czech Technical University

  • Place of publication

    Prague

  • Event location

    Prague

  • Event date

    Mar 22, 2004

  • Type of event by nationality

    CST - Celostátní akce

  • UT code for WoS article