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Transport properties of metal-semiconductor junctions on n-type InP prepared by electrophoretic deposition of Pt nanoparticles

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F67985882%3A_____%2F14%3A00428559" target="_blank" >RIV/67985882:_____/14:00428559 - isvavai.cz</a>

  • Result on the web

    <a href="http://dx.doi.org/10.1088/0268-1242/29/4/045017" target="_blank" >http://dx.doi.org/10.1088/0268-1242/29/4/045017</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1088/0268-1242/29/4/045017" target="_blank" >10.1088/0268-1242/29/4/045017</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Transport properties of metal-semiconductor junctions on n-type InP prepared by electrophoretic deposition of Pt nanoparticles

  • Original language description

    Electrical properties of highly rectifying Pt/InP junctions fabricated by electrophoretic deposition of Pt nanoparticles are investigated at different temperatures by the measurement of current-voltage and capacitance-voltage characteristics. The forwardI-V characteristics of the junction are described by thermionic emissions theory at low forward bias (3kT/q < V < 0.2 V) and by tunnelling current transport through the narrowed space charge region at forward bias V > 0.2 V. The reverse I-V characteristics are analysed in the scope of the thermionic emission model in the presence of shunt resistance. Electrical characteristics of these diodes are sensitive to gas mixtures with a low hydrogen concentration and show an extremely fast response and recovery time

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

  • CEP classification

    JA - Electronics and optoelectronics

  • OECD FORD branch

Result continuities

  • Project

    <a href="/en/project/LD12014" target="_blank" >LD12014: Role of the interface in the preparation of high quality Schottky barriers on III-V semiconductors.</a><br>

  • Continuities

    I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Others

  • Publication year

    2014

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Semiconductor Science and Technology

  • ISSN

    0268-1242

  • e-ISSN

  • Volume of the periodical

    29

  • Issue of the periodical within the volume

    4

  • Country of publishing house

    GB - UNITED KINGDOM

  • Number of pages

    8

  • Pages from-to

  • UT code for WoS article

    000333275600019

  • EID of the result in the Scopus database