Optical Fingerprint of Flat Substrate Surface and Marker-Free Lateral Displacement Detection with Angstrom-Level Precision
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F67985882%3A_____%2F22%3A00565120" target="_blank" >RIV/67985882:_____/22:00565120 - isvavai.cz</a>
Result on the web
<a href="https://doi.org/10.1103/PhysRevLett.129.213201" target="_blank" >https://doi.org/10.1103/PhysRevLett.129.213201</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1103/PhysRevLett.129.213201" target="_blank" >10.1103/PhysRevLett.129.213201</a>
Alternative languages
Result language
angličtina
Original language name
Optical Fingerprint of Flat Substrate Surface and Marker-Free Lateral Displacement Detection with Angstrom-Level Precision
Original language description
We report that flat substrates such as glass coverslips with surface roughness well below 0.5 nm feature notable speckle patterns when observed with high-sensitivity interference microscopy. We uncover that these speckle patterns unambiguously originate from the subnanometer surface undulations, and develop an intuitive model to illustrate how subnanometer nonresonant dielectric features could generate pronounced interference contrast in the far field. We introduce the concept of optical fingerprint for the deterministic speckle pattern associated with a particular substrate surface area and intentionally enhance the speckle amplitudes for potential applications. We demonstrate such optical fingerprints can be leveraged for reproducible position identification and marker-free lateral displacement detection with an experimental precision of 0.22 nm. The reproducible position identification allows us to detect new nanoscopic features developed during laborious processes performed outside of the microscope. The demonstrated capability for ultrasensitive displacement detection may find applications in the semi-conductor industry and superresolution optical microscopy.
Czech name
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Czech description
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Classification
Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
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OECD FORD branch
10306 - Optics (including laser optics and quantum optics)
Result continuities
Project
<a href="/en/project/GA22-11753S" target="_blank" >GA22-11753S: Megahertz Imaging of Microtubule Dynamics by Interferometric Scattering Microscopy</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Others
Publication year
2022
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Physical Review Letters
ISSN
0031-9007
e-ISSN
1079-7114
Volume of the periodical
129
Issue of the periodical within the volume
21
Country of publishing house
US - UNITED STATES
Number of pages
7
Pages from-to
213201
UT code for WoS article
000886221300006
EID of the result in the Scopus database
2-s2.0-85143315758