Characterisation and nanometer-scale modifications of Bi 2 Te 3 surface via the atomic force microscopy.
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F67985882%3A_____%2F99%3A13990109" target="_blank" >RIV/67985882:_____/99:13990109 - isvavai.cz</a>
Alternative codes found
RIV/61388980:_____/99:13990109
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Characterisation and nanometer-scale modifications of Bi 2 Te 3 surface via the atomic force microscopy.
Original language description
Original scientific paper dealing with Characterisation and nanometer-scale modifications of Bi 2 Te 3 surface via the atomic force microscopy.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Others
Publication year
1999
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Preliminary Proceedings of STM'99.
ISBN
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ISSN
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e-ISSN
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Number of pages
2
Pages from-to
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Publisher name
[Seoul University]
Place of publication
[Seoul]
Event location
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Event date
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Type of event by nationality
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UT code for WoS article
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