Characterization of near-field optical microscope probes
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081723%3A_____%2F08%3A00314129" target="_blank" >RIV/68081723:_____/08:00314129 - isvavai.cz</a>
Alternative codes found
RIV/00216224:14310/08:00025409 RIV/00177016:_____/08:#0000389
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Characterization of near-field optical microscope probes
Original language description
In this article the far-field radiation analysis of near-field optical probes is presented.
Czech name
Charakterizace sond pro optickou mikroskopii v blízkém poli
Czech description
V tomto článku prezentujeme vyzařovací analýzy optických sond.
Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
BL - Plasma physics and discharge through gases
OECD FORD branch
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Result continuities
Project
<a href="/en/project/FT-TA3%2F142" target="_blank" >FT-TA3/142: Analysis of the optical properties of solar cells.</a><br>
Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2008
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Surface and Interface Analysis
ISSN
0142-2421
e-ISSN
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Volume of the periodical
40
Issue of the periodical within the volume
3-4
Country of publishing house
GB - UNITED KINGDOM
Number of pages
4
Pages from-to
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UT code for WoS article
000255486200079
EID of the result in the Scopus database
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