Relationship between the nanoindentation response of amorphous carbon thin films and the depth profile of their structure

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081723%3A_____%2F08%3A00336986" target="_blank" >RIV/68081723:_____/08:00336986 - isvavai.cz</a>

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

Relationship between the nanoindentation response of amorphous carbon thin films and the depth profile of their structure

Original language description

In this work, we studied the relationship between the nanoindentation response of amorphous carbon thin films and the depth profile of their structure.

Czech name

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Czech description

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Type

O - Miscellaneous

CEP classification

BL - Plasma physics and discharge through gases

OECD FORD branch

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Project

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Continuities

Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year

2008

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů