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The structural studies and optical characteristics of phase-segregated Ir-doped LuFeO3-delta films

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081723%3A_____%2F23%3A00570601" target="_blank" >RIV/68081723:_____/23:00570601 - isvavai.cz</a>

  • Alternative codes found

    RIV/00216305:26620/23:PU148607

  • Result on the web

    <a href="https://link.springer.com/article/10.1007/s00339-023-06486-4" target="_blank" >https://link.springer.com/article/10.1007/s00339-023-06486-4</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1007/s00339-023-06486-4" target="_blank" >10.1007/s00339-023-06486-4</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    The structural studies and optical characteristics of phase-segregated Ir-doped LuFeO3-delta films

  • Original language description

    In this work, we carefully examined how Ir substitution into Fe sites can change the band of the LuFeO3 (LFO) material. LFO and Ir-doped LFO (LuFe1-xIrxO3 or LFIO for short, where x = 0.05 and 0.10) thin films were synthesized by utilizing magnetron sputtering techniques. The films were grown on silicon and indium tin oxide (ITO) substrates at 500 degrees C. The crystallographic orientation of the films was examined using X-ray diffraction (XRD) analysis. The crystallographic orientation of the thin films was examined using an X-ray diffractometer (XRD). For surface topography research, atomic force microscopy (AFM) was employed. To look for the recombination of photogenerated electron-hole pairs in the materials under investigation, photoluminescence (PL) spectroscopy was used. Raman spectroscopy is then utilized to gather data on crystal symmetry as well as disorders and defects in the oxide materials. It was demonstrated that the LFO band gap was altered from 2.35 to 2.72 eV by Ir substitution into Fe sites. Moreover, diffuse reflectance spectroscopy (DRS) was used to analyze conductivity, real and imaginary components of the dielectric constant, refractive index (n), extinction coefficient (k), and reflectance percentage.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database

  • CEP classification

  • OECD FORD branch

    10302 - Condensed matter physics (including formerly solid state physics, supercond.)

Result continuities

  • Project

    <a href="/en/project/LM2018110" target="_blank" >LM2018110: CzechNanoLab research infrastructure</a><br>

  • Continuities

    I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Others

  • Publication year

    2023

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Applied Physics A - Materials Science & Processing

  • ISSN

    0947-8396

  • e-ISSN

    1432-0630

  • Volume of the periodical

    129

  • Issue of the periodical within the volume

    3

  • Country of publishing house

    DE - GERMANY

  • Number of pages

    14

  • Pages from-to

    198

  • UT code for WoS article

    000935899600001

  • EID of the result in the Scopus database

    2-s2.0-85148488069