The structural studies and optical characteristics of phase-segregated Ir-doped LuFeO3-delta films
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081723%3A_____%2F23%3A00570601" target="_blank" >RIV/68081723:_____/23:00570601 - isvavai.cz</a>
Alternative codes found
RIV/00216305:26620/23:PU148607
Result on the web
<a href="https://link.springer.com/article/10.1007/s00339-023-06486-4" target="_blank" >https://link.springer.com/article/10.1007/s00339-023-06486-4</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1007/s00339-023-06486-4" target="_blank" >10.1007/s00339-023-06486-4</a>
Alternative languages
Result language
angličtina
Original language name
The structural studies and optical characteristics of phase-segregated Ir-doped LuFeO3-delta films
Original language description
In this work, we carefully examined how Ir substitution into Fe sites can change the band of the LuFeO3 (LFO) material. LFO and Ir-doped LFO (LuFe1-xIrxO3 or LFIO for short, where x = 0.05 and 0.10) thin films were synthesized by utilizing magnetron sputtering techniques. The films were grown on silicon and indium tin oxide (ITO) substrates at 500 degrees C. The crystallographic orientation of the films was examined using X-ray diffraction (XRD) analysis. The crystallographic orientation of the thin films was examined using an X-ray diffractometer (XRD). For surface topography research, atomic force microscopy (AFM) was employed. To look for the recombination of photogenerated electron-hole pairs in the materials under investigation, photoluminescence (PL) spectroscopy was used. Raman spectroscopy is then utilized to gather data on crystal symmetry as well as disorders and defects in the oxide materials. It was demonstrated that the LFO band gap was altered from 2.35 to 2.72 eV by Ir substitution into Fe sites. Moreover, diffuse reflectance spectroscopy (DRS) was used to analyze conductivity, real and imaginary components of the dielectric constant, refractive index (n), extinction coefficient (k), and reflectance percentage.
Czech name
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Czech description
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Classification
Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
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OECD FORD branch
10302 - Condensed matter physics (including formerly solid state physics, supercond.)
Result continuities
Project
<a href="/en/project/LM2018110" target="_blank" >LM2018110: CzechNanoLab research infrastructure</a><br>
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Others
Publication year
2023
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Applied Physics A - Materials Science & Processing
ISSN
0947-8396
e-ISSN
1432-0630
Volume of the periodical
129
Issue of the periodical within the volume
3
Country of publishing house
DE - GERMANY
Number of pages
14
Pages from-to
198
UT code for WoS article
000935899600001
EID of the result in the Scopus database
2-s2.0-85148488069