Field Ion Microscopy of Tungsten Nano-Tips Coated with Thin Layer of Epoxy Resin
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081723%3A_____%2F24%3A00600424" target="_blank" >RIV/68081723:_____/24:00600424 - isvavai.cz</a>
Alternative codes found
RIV/68081731:_____/24:00600424 RIV/00216305:26220/24:PU155800
Result on the web
<a href="https://www.mdpi.com/2227-7080/12/10/193" target="_blank" >https://www.mdpi.com/2227-7080/12/10/193</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.3390/technologies12100193" target="_blank" >10.3390/technologies12100193</a>
Alternative languages
Result language
angličtina
Original language name
Field Ion Microscopy of Tungsten Nano-Tips Coated with Thin Layer of Epoxy Resin
Original language description
This paper presents an analysis of the field ion emission mechanism of tungsten-epoxy nanocomposite emitters and compares their performance with that of tungsten nano-field emitters. The emission mechanism is described using the theory of induced conductive channels. Tungsten emitters with a radius of 70 nm were fabricated using electrochemical polishing and coated with a 20 nm epoxy resin layer. Characterization of the emitters, both before and after coating, was performed using electron microscopy and energy-dispersive X-ray spectroscopy (EDS). The Tungsten nanocomposite emitter was tested using a field ion microscope (FIM) in the voltage range of 0-15 kV. The FIM analyses revealed differences in the emission ion density distributions between the uncoated and coated emitters. The uncoated tungsten tips exhibited the expected crystalline surface atomic distribution in the FIM images, whereas the coated emitters displayed randomly distributed emission spots, indicating the formation of induced conductive channels within the resin layer. The atom probe results are consistent with the FIM findings, suggesting that the formation of conductive channels is more likely to occur in areas where the resin surface is irregular and exhibits protrusions. These findings highlight the distinct emission mechanisms of both emitter types.
Czech name
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Czech description
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Classification
Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
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OECD FORD branch
21001 - Nano-materials (production and properties)
Result continuities
Project
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Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Others
Publication year
2024
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Technologies
ISSN
2227-7080
e-ISSN
2227-7080
Volume of the periodical
12
Issue of the periodical within the volume
10
Country of publishing house
CH - SWITZERLAND
Number of pages
13
Pages from-to
193
UT code for WoS article
001342552100001
EID of the result in the Scopus database
2-s2.0-85207682950