Frequency Noise Analysis of Semiconductor Lasers.

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F01%3A12010002" target="_blank" >RIV/68081731:_____/01:12010002 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
Frequency Noise Analysis of Semiconductor Lasers.
Original language description
For a fundamental etalon of optical frequency based on the external-cavity semiconductor laser (ECL), not only the long-term frequency stability but also the linewidth seems to be an important parameter. The linewidth broadening is dominated by fluctuations (noise) of the optical frequency. Parameters of these fluctuations and their spectral characteristics are crucial information for their suppression. We present an experimental setup for the frequency noise measurements designed for a free running 633nm ECL with a stabilized reference He-Ne laser. We observed the corner frequency of the 1/f noise of the ECL of approx. 10 MHz. No significant spectral components over the 1/f noise corner frequency were found.
Czech name
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Czech description
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Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year
2001
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection
Proceedings of the 12th Czech-Slovak-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics (Proc. SPIE 4356).
ISBN
0-8194-4047-7
ISSN
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e-ISSN
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Number of pages
6
Pages from-to
277-282
Publisher name
SPIE-The International Society for Optical Engineering
Place of publication
Washington
Event location
Velké Losiny [CZ]
Event date
Sep 12, 2000
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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