The possibilities of using FFT for rating the quality of detected signal in ESEM.
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F02%3A12020039" target="_blank" >RIV/68081731:_____/02:12020039 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
The possibilities of using FFT for rating the quality of detected signal in ESEM.
Original language description
The main demand for processing of images from scanning electron microscope is acquirement of the best quality of raster image and description of attributes of micrographs and possibility of their comparison with other micrographs. Therefore software wascompiled, which serves to numerical calculation of the Fast Fourier Transform (FFT) of micrographs, evaluation and development of their quality.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
<a href="/en/project/GA102%2F01%2F1271" target="_blank" >GA102/01/1271: Study of detection methods and systems in extreme conditions of environmental scanning electron microscopy</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2002
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Proceedings of the 2nd annual meeting of the Czechoslovak microscopy society.
ISBN
80-238-8749-1
ISSN
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e-ISSN
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Number of pages
4
Pages from-to
91-94
Publisher name
CSMS
Place of publication
Brno
Event location
Vranovská Ves [CZ]
Event date
Feb 8, 2002
Type of event by nationality
EUR - Evropská akce
UT code for WoS article
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