Auger electron spectro-microscopy.
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F03%3A12030049" target="_blank" >RIV/68081731:_____/03:12030049 - isvavai.cz</a>
Alternative codes found
RIV/00216305:26220/03:PU36507
Result on the web
—
DOI - Digital Object Identifier
—
Alternative languages
Result language
angličtina
Original language name
Auger electron spectro-microscopy.
Original language description
The short escape depth of Auger electrons, the high lateral resolution, the chemical information about superficial elemental composition and the possibility of measuring the indepth distribution of elements (with utilisation of the ion sputtering) are the main advantages of the Auger electron spectroscopy (AES). When combined with the scanning electron miscroscope, AES can provide with image signal suitable for spectro-micrographs showing distribution of elements over the surface, i.e. the chemical mapping. This mapping can be advantageously compared with other SEM image signals in order to faciliate their interpretation.
Czech name
—
Czech description
—
Classification
Type
D - Article in proceedings
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
—
Result continuities
Project
—
Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2003
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Proceedings of the 9th Conference and Competition Student EEICT 2003 - Papers written by postgraduate students.
ISBN
80-214-2379-X
ISSN
—
e-ISSN
—
Number of pages
5
Pages from-to
450-454
Publisher name
Brno University of Technology
Place of publication
Brno
Event location
Brno [CZ]
Event date
Apr 24, 2003
Type of event by nationality
CST - Celostátní akce
UT code for WoS article
—