Calculation of Aberration Coefficients by Ray Tracing.

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F03%3A12030074" target="_blank" >RIV/68081731:_____/03:12030074 - isvavai.cz</a>

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

Calculation of Aberration Coefficients by Ray Tracing.

Original language description

Basic optical properties as well as aberation coefficients of electrostatic and magnetic round lenses and multipoles can be easily and quickly calculated with a standard program packaged like ELD or MLD [1]. They calculate cardinal elements and aberration coefficients of a lens directly by solving paraxial trajectory equation and aberration integrals from axial potential and fields, obtained from the computations by the first order finite element method. From known values of transfer matrix and aberration components we can evaluate positions and slopes of particle trajectories in a plane after a lens.

Czech name

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Czech description

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Type

J_x - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

CEP classification

JA - Electronics and optoelectronics

OECD FORD branch

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Project

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Continuities

Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year

2003

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Microscopy and Microanalysis

ISSN

1431-9276

e-ISSN

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Volume of the periodical

9

Issue of the periodical within the volume

Sup. 3

Country of publishing house

US - UNITED STATES

Number of pages

2

Pages from-to

26-27

UT code for WoS article

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EID of the result in the Scopus database

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