Very Low Energy Scanning Electron Microscope

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F04%3A00109096" target="_blank" >RIV/68081731:_____/04:00109096 - isvavai.cz</a>

Alternative codes found

RIV/00216305:26220/04:PU45208

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

Very Low Energy Scanning Electron Microscope

Original language description

An ultrahigh vacuum Scanning Electron Microscope with a Schottky field emission gun for surface analysis has been finished. The microscope is adapted to Auger spectroscopy and spectromicroscopy, SLEEM (Scanning Low Energy Electron Microscopy) and SLETEM(Scanning Low Energy Transmission Electron Microscopy)

Czech name

Rastrovací elektronový mikroskop s pomalými elektrony

Czech description

Byl dokončen ultravakuový elektronový mikroskop se Schottkyho katodou pro stadium povrchů. Mikroskop umožňuje Augerovu spektroskopii a spektromikroskopii, rastrovací elektronovou mikroskopii pomalými elektrony (SLEEM) a rastrovací prozařovací elektronovou mikroskopii pomalými elektrony (SLETEM)

Type

J_x - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

CEP classification

JA - Electronics and optoelectronics

OECD FORD branch

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Project

<a href="/en/project/KJB2065405" target="_blank" >KJB2065405: Examination of nanostructures by electron beam</a><br>

Continuities

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year

2004

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

G.I.T. Imaging and Microscopy

ISSN

1439-4243

e-ISSN

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Volume of the periodical

6

Issue of the periodical within the volume

4

Country of publishing house

DE - GERMANY

Number of pages

3

Pages from-to

47-49

UT code for WoS article

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EID of the result in the Scopus database

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