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Grain Contrast in Very Low Energy SEM

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F07%3A00308385" target="_blank" >RIV/68081731:_____/07:00308385 - isvavai.cz</a>

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    Grain Contrast in Very Low Energy SEM

  • Original language description

    When lowering energy of incident electrons to 100 eV and less, the elastic scattering becomes heavily anisotropic while the inelastic scattering progressively drops off. Energy dependence of the reflected signal becomes then specific to the crystal orientation. The experiments with the imaging of the metal polycrystals were done in the SEM equipped by the cathode lens.

  • Czech name

    Kontrast zrn na velmi nízkých energiích v REM

  • Czech description

    Při snižování energie dopadajících elektronů na 100 eV a méně se pružný rozptyl stává silně anizotropní, zatímco nepružný rozptyl výrazně klesá. Energiová závislost odraženého signálu se pak stává specifická pro určitou krystalovou orientaci. Experimentyumožňující takto zobrazení kovových polykrystalů byly provedeny v REM vybaveném katodovou čočkou.

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    JA - Electronics and optoelectronics

  • OECD FORD branch

Result continuities

  • Project

    <a href="/en/project/GA202%2F04%2F0281" target="_blank" >GA202/04/0281: Mapping at a high spatial resolution of the local density of electron states via reflection of very slow electrons</a><br>

  • Continuities

    Z - Vyzkumny zamer (s odkazem do CEZ)

Others

  • Publication year

    2007

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    Proceedings of the 8th Multinational Congress on Microscopy

  • ISBN

    978-80-239-9397-4

  • ISSN

  • e-ISSN

  • Number of pages

    2

  • Pages from-to

    63-64

  • Publisher name

    Czechoslovak Microscopy Society

  • Place of publication

    Prague

  • Event location

    Prague

  • Event date

    Jun 17, 2007

  • Type of event by nationality

    EUR - Evropská akce

  • UT code for WoS article