Comparison of 127 I 2 -stabilized frequency-doubled Nd:YAG lasers and evaluation of frequency shifts caused by iodine cells
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F08%3A00314958" target="_blank" >RIV/68081731:_____/08:00314958 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Comparison of 127 I 2 -stabilized frequency-doubled Nd:YAG lasers and evaluation of frequency shifts caused by iodine cells
Original language description
We present results of measurement of purity of a set of iodine cells made at our institute. The purity was tested by improved method based on measurement of induced fluorescence and evaluation by the Stern-Volmer formula. The reproducibility of the fluorescence detection system was improved by introducing of additional compensation for the pumping laser spectral and power instabilities. Frequency-doubled Nd:YAG lasers stabilized with these cells were compared to evaluate their frequency shifts. The absolute frequencies of selected iodine hyperfine transitions were measured in direct laser frequency comparison with the reproducibility well below the kHz level. The results indicating the iodine cell purity are presented with relation to the absolute frequency shifts. This not only highlights the influence of iodine cell quality onto the stability and absolute frequency of laser etalons but also shows the way towards improvements of the iodine cell manufacturing technology.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
BH - Optics, masers and lasers
OECD FORD branch
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Result continuities
Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2008
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Optical Micro- and Nanometrology in Microsystems Technology II. (Proceedings of SPIE Vol. 6995)
ISBN
978-0-8194-7193-2
ISSN
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e-ISSN
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Number of pages
6
Pages from-to
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Publisher name
SPIE
Place of publication
Bellingham
Event location
Strasbourg
Event date
Apr 8, 2008
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
000257885600022