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Laser sources at 760 nm wavelength for metrology of length

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F09%3A00336817" target="_blank" >RIV/68081731:_____/09:00336817 - isvavai.cz</a>

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    Laser sources at 760 nm wavelength for metrology of length

  • Original language description

    First set-up of the laser source based on the DFB (Distributed FeedBack) laser diode is presented. We used the DFB laser diode at 760 nm wavelength with mode-hop free tuning range above 1 nm and fiber output up to 10 mW. We present our first characteristics without external stabilization of the output wavelength. We compared our new DFB laser source with our previously developed laser source with VCSEL (Vertical Cavity Surface Emitting Laser) diode. We present set-up of the laser interferometer proposedwith respect to using of our laser sources. The design of optical set-up of the experimental interferometer is realized using fiber optics to reduce the influence of the index of refraction of air. The laser interferometer in the first set-up was used for absolute measurement of length. We used the method of the frequency stabilization on optical resonator to stabilize of frequency of laser diode and measurement of the tuneability of the wavelength.

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    BH - Optics, masers and lasers

  • OECD FORD branch

Result continuities

  • Project

    Result was created during the realization of more than one project. More information in the Projects tab.

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)

Others

  • Publication year

    2009

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    Africon 2009

  • ISBN

    978-1-4244-3918-8

  • ISSN

  • e-ISSN

  • Number of pages

    6

  • Pages from-to

  • Publisher name

    IEEE

  • Place of publication

    Los Alamitos

  • Event location

    Nairobi

  • Event date

    Sep 23, 2009

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article